Dr. Fridline is the Chair of the Engineering Department.
Ph.D., Engineering, Mechanics of Solids and Structures, Brown University
Sc.M., Engineering, Mechanics of Solids and Structures, Brown University
B.S., Mechanical Engineering, SUNY Binghamton
Licensed Professional Engineer, New York State
- Computational mechanics of materials
- Finite element analysis
- Fatigue and fracture of metallic and composite structures
- Structural health monitoring
Owner and Principal, Matrix Technologies, LLC, New York, NY
Manager of Engineering, STRAAM Corporation, New York, NY
Principal Research Engineer, Northrop Grumman Corporation, Bethpage, NY
Senior Project Manager, CAE Associates, Woodbury, CT
Nuclear Machinist Mate, Submarines, USS Baltimore (SSN-704)
John M. Papazian, Elias L. Anagnostou, Robert J. Christ, Jr., Stephen J. Engel, Daniel Fridline, David Hoitsma, John Madsen, Jerrell Nardiello, Joel Payne, William Pember, Robert P. Silberstein, Paul C. Hoffman, Alysha M. Roerden and Glenn Werczynski; 鈥淔ull-scale Fatigue Test of a Retired EA-6B Outer Wing Panel鈥, to be published in International Journal of Fatigue, November 2009.
J.C. Newman Jr., B. Jordan, E.L. Anagnostou, D. Fridline, David Rusk: 鈥淔atigue and Crack-Growth Analyses on Specimens Simulating Details In Wing Panels Of Naval Aircraft鈥, Aging Aircraft 2008.
John M. Papazian, Elias L. Anagnostou, Stephen J. Engel, Daniel R. Fridline, David H. Hoitsma, John S. Madsen, Robert P. Silberstein, James B. Whiteside: 鈥淪tructural Integrity Prognosis,鈥 ICAF 2007, Durability and Damage Tolerance of Aircraft Structures: Metals vs. Composites, Proceedings 24th Symposium, L. Lazzeri and A. Salvetti, eds., Naples, Italy, pp. 109-125, 16-18 May 2007.
J. M. Papazian, E. L. Anagnostou, S. Engel, D. Fridline, D. Hoitsma, J. Madsen, J. Nardiello, R. Silberstein, G. Welsh, J. B. Whiteside. 鈥淪IPS, A Structural Integrity Prognosis System.鈥 IEEE Aerospace Conference, March 3-10, 2007.
Peter Barrett and Daniel Fridline. 鈥淯ser Implemented Nitinol Material Model in ANSYS鈥 ANSYS Users Conference, May 24-26, 2004.
Daniel Fridline and Allan Bower. 鈥淣umerical Simulations of Stress Induced Void Evolution and Growth In Interconnects'鈥. J. Appl. Phys., Vol. 91. 2002